EFFECTS OF LOCAL FIELD VARIATIONS ON THE CONTRAST OF A FIELD-ION MICROSCOPEHOMEIER HHH; KINGHAM DR.1983; JOURNAL OF PHYSICS D: APPLIED PHYSICS; ISSN 0022-3727; GBR; DA. 1983; VOL. 16; NO 6; PP. L115-L120; BIBL. 8 REF.Article

THE MEASUREMENT AND CALCULATION OF LOOP TEMPERATURES IN AN FIMMORIKAWA H; KOZAKAI M; TERAO T et al.1982; J. VAC. SCI. TECHNOL.; ISSN 0022-5355; USA; DA. 1982; VOL. 21; NO 1; PP. 95-99; BIBL. 5 REF.Article

COMPUTERS IN FIELD ION MICROSCOPY (REVIEW)SUVOROV AL; RAZINKOVA TL; SOKOLOV AG et al.1980; PHYS. STATUS SOLIDI, SECT. A, APPL. RES.; DDR; DA. 1980-09-16; VOL. 61; NO 1; PP. 11-52; BIBL. 146 REF.Article

A CONTROLLED SPECIMEN PREPARATION TECHNIQUE FOR INTERFACE STUDIES WITH ATOM-PROBE FIELD-ION MICROSCOPYHENJERED A; NORDEN H.1983; JOURNAL OF PHYSICS E: SCIENTIFIC INSTRUMENTS; ISSN 0022-3735; GBR; DA. 1983; VOL. 16; NO 7; PP. 617-619; BIBL. 5 REF.Article

STRUCTURE AND INITIAL PRECIPITATION IN A RAPIDLY SOLIDIFIED NICKEL SUPERALLOYWOOD JV; MILLS PF; BINGHAM JK et al.1979; METALLURG. TRANS. A; USA; DA. 1979; VOL. 10; NO 5; PP. 575-584; BIBL. 27 REF.Article

FIELD-ION MICROSCOPY. A REVIEW OF BASIC PRINCIPLES AND SELECTED APPLICATIONSPANITZ JA.1982; JOURNAL OF PHYSICS E: SCIENTIFIC INSTRUMENTS; ISSN 0022-3735; GBR; DA. 1982; VOL. 15; NO 12; PP. 1281-1294; BIBL. 3 P.Article

FIELD ION MICROSCOPY OF TANTALUM AND NIOBIUM AT LOW RESIDUAL GAS PRESSURESKRAUTZ E; HAIML G.1981; Z. METALLKD.; DEU; DA. 1981-02; VOL. 72; NO 2; PP. 116-119; BIBL. 16 REF.Article

KINETICS OF FIELD EVAPORATION (PULSED REGIME)BOBKOV AF; SUVOROV AL.1980; ZH. EKSP. TEOR. FIZ.; SUN; DA. 1980-10; VOL. 79; NO 4; PP. 1376-1384; BIBL. 39 REF.Article

A STUDY OF THE EARLY STAGES OF TEMPERING OF IRON-CARBON MARTENSITES BY ATOM PROBE FIELD ION MICROSCOPYMILLER MK; BEAVEN PA; SMITH GDW et al.1981; METALL. TRANS., A; USA; DA. 1981-07; VOL. 12A; NO 7; PP. 1197-1204; BIBL. 57 REF.Article

STUDY OF SILICIDE PHASE FORMATION AND DECOMPOSITION PROCESSES IN NIOBIUM-SILICON SYSTEM BY FIELD EMISSION MICROSCOPYPUGACHEVICH VP; CHISTYAKOV YU D; TIMOSHENKOV SP et al.1982; FIZ. MET. METALLOVED.; ISSN 0015-3230; SUN; DA. 1982; VOL. 54; NO 3; PP. 499-506; BIBL. 21 REF.Article

A GONIOMETER HEAD FOR AN ATOM-PROBE FIELD ION MICROSCOPESARRAU JM; GALLOT J; AVENEL O et al.1981; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1981; VOL. 14; NO 7; PP. 800-802; BIBL. 10 REF.Article

TISSUE LOCALIZATION OF STABLE AND RADIOACTIVE NUCLIDES BY SECONDARY-ION MICROSCOPYGALLE P.1982; J. NUCL. MED.; ISSN 0022-3123; USA; DA. 1982; VOL. 23; NO 1; PP. 52-57; BIBL. 18 REF.Article

FIELD-ION MICROSCOPIC STUDY OF SURFACE SELF-DIFFUSION ON TUNGSTEN SURFACESSADAKANE Y; ABE T; HIRANO K et al.1981; J. JAP. INST. MET.; JPN; DA. 1981-01; VOL. 45; NO 1; PP. 20-28; BIBL. 6 REF.Article

FIELD AND TEMPERATURE DEPENDENCE OF THE DIRECTIONAL WALK OF SINGLE ADSORBED W ATOMS ON THE W(110) PLANE = VARIATION AVEC LA TEMPERATURE ET LE CHAMP DU PARCOURS DANS UNE DIRECTION D'ATOMES DE W SEULS ADSORBES SUR LE PLAN W (110)WANG SC; TSONG TT.1982; PHYSICAL REVIEW. B: CONDENSED MATTER; ISSN 0163-1829; USA; DA. 1982; VOL. 26; NO 12; PP. 6470-6475; BIBL. 14 REF.Article

ION CHANNELING EFFECTS IN SCANNING ION MICROSCOPY WITH A 60 KEV GA⁺ PROBELEVI SETTI R; FOX TR; KIN LAM et al.1983; NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH; ISSN 0167-5087; NLD; DA. 1983; VOL. 205; NO 1-2; PP. 299-309; BIBL. 28 REF.Article

ON THE ATOMIC STRUCTURE OF (001) WTUNG RT; GRAHAM WR.1982; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1982; VOL. 2; NO 2; PP. 576-598; BIBL. 25 REF.Article

PULSED-LASER TIME-OF-FLIGHT ATOM-PROBE FIELD ION MICROSCOPETSONG TT; MCLANE SB; KINKUS TJ et al.1982; REVIEW OF SCIENTIFIC INSTRUMENTS; ISSN 0034-6748; USA; DA. 1982; VOL. 53; NO 9; PP. 1442-1448; BIBL. 21 REF.Article

DETERMINATION DE LA CONFIGURATION DES ATOMES SUR LES JOINTS DE MACLE DU TUNGSTENE PAR LA METHODE DE LA MICROSCOPIE IONIQUE PAR EMISSION DE CHAMPMIKHAJLOVSKIJ IM.1982; FIZIKA TVERDOGO TELA; ISSN 0367-3294; SUN; DA. 1982; VOL. 24; NO 11; PP. 3210-3215; BIBL. 17 REF.Article

GRAIN BOUNDARY DISLOCATION OBSERVATIONS USING THE FIELD ION MICROSCOPEEATON HC.1981; PHYS. STATUS SOLIDI, SECT. A, APPL. RES.; DDR; DA. 1981-06-16; VOL. 65; NO 2; PP. 497-502; BIBL. 15 REF.Article

DIGITAL IMAGE PROCESSING FOR IMAGE QUANTIFICATION IN ION MICROSCOPE ANALYSIS = TRAITEMENT NUMERIQUE DES IMAGES POUR LA QUANTIFICATION DE L'IMAGE EN ANALYSE PAR MICROSCOPIE IONIQUEDRUMMER DM; MORRISON GH.1980; ANAL. CHEM. (WASH.); ISSN 0003-2700; USA; DA. 1980; VOL. 52; NO 13; PP. 2147-2152; BIBL. 33 REF.Article

MICROSTRUCTURAL OBSERVATIONS ON HIGH STRENGTH POLYCRYSTALLINE IRON WHISKERSWILSDORF HGF; INAL OT; MURR LE et al.1978; Z. METALLKDE; DEU; DA. 1978; VOL. 69; NO 11; PP. 701-705; ABS. GER; BIBL. 7 REF.Article

EFFECT OF TEMPERATURE ON THE WORK FUNCTION OF TIN = EFFET DE LA TEMPERATURE SUR LE TRAVAIL DE SORTIE DE L'ETAINZEBROWSKI J.1982; ACTA PHYSICA POLONICA. A; ISSN 0587-4246; POL; DA. 1982; VOL. 61; NO 5; PP. 459-461; BIBL. 8 REF.Article

FIELD-ION MICROSCOPICAL DETERMINATION OF THE PENETRATION DEPTH OF AN ELECTRIC FIELD INTO A METALDRANOVA ZH I; MIKHAJLOVSKIJ IM.1981; ZH. TEKH. FIZ.; SUN; DA. 1981-04; VOL. 51; NO 4; PP. 845-849; BIBL. 15 REF.Article

EVIDENCE FOR RECONSTRUCTED (001) TUNGSTEN OBTAINED BY FIELD-ION-MICROSCOPY = MISE EN EVIDENCE DE TUNGSTENE (001) RECONSTRUIT PAR MICROSCOPIE IONIQUE A EMISSION DE CHAMPMELMED AJ; TUNG RT; GRAHAM WR et al.1979; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1979; VOL. 43; NO 20; PP. 1521-1524; BIBL. 10 REF.Article

FIELD-ION MICROSCOPE DETECTION OF ULTRA-FINE DEFECTS IN NEUTRON-IRRADIATED FE-0.34 PCT CU ALLOYBRENNER SS; WAGNER R; SPITZNAGEL JA et al.1978; METALLURG. TRANS. A; USA; DA. 1978; VOL. 9; NO 12; PP. 1761-1764; BIBL. 15 REF.Conference Paper